STEM image simulation by Bloch-wave method with layer-by-layer representation
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Electron Microscopy
سال: 2010
ISSN: 0022-0744,1477-9986
DOI: 10.1093/jmicro/dfq028